Study on temperature characteristic of noise of HgCdTe shaft temperature detector

YE Bai-song; LIU Fei; YUAN Yong-gang; LI Xiang-yang

doi:10.13873/j.1000-97872013.12.016

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Study on temperature characteristic of noise of HgCdTe shaft temperature detector

更新时间：2025-09-11

- Study on temperature characteristic of noise of HgCdTe shaft temperature detector
- Vol. 32, Issue 12, Pages: 49-51+54(2013)
- 作者机构：
  
  1. 中国科学院上海技术物理研究所红外成像与器件重点实验室
  2. 中国科学院研究生院
- 作者简介：
- 基金信息：
- DOI：10.13873/j.1000-97872013.12.016
  CLC： TN215
- Published：2013
- 稿件说明：
移动端阅览
[1]叶柏松,刘飞,袁永刚,李向阳.HgCdTe轴温探测器噪声的温度特性研究[J].传感器与微系统,2013,32(12):49-51+54.

YE Bai-song, LIU Fei, YUAN Yong-gang, et al. Study on temperature characteristic of noise of HgCdTe shaft temperature detector[J]. 2013, 32(12): 49-51+54.
[1]叶柏松,刘飞,袁永刚,李向阳.HgCdTe轴温探测器噪声的温度特性研究[J].传感器与微系统,2013,32(12):49-51+54. DOI： 10.13873/j.1000-97872013.12.016.

YE Bai-song, LIU Fei, YUAN Yong-gang, et al. Study on temperature characteristic of noise of HgCdTe shaft temperature detector[J]. 2013, 32(12): 49-51+54. DOI： 10.13873/j.1000-97872013.12.016.

摘要

针对HgCdTe列车轴温探测器

通过测量不同温度下其噪声功率谱的变化

研究了温度对器件噪声的影响。实验结果表明:在-30

0℃范围内

当温度降低时

探测器噪声显著增加

最大增幅分别达到2.7倍（偏流为1 mA时）和3.6倍（偏流为2 mA时）。经过理论分析发现

探测器热噪声对总噪声的贡献很小

温度变化的主要影响是器件的产生—复合噪声和1/f噪声。

Abstract

The influence of the temperature on the noise for the HgCdTe shaft temperature detector is studied by measuring variation of noise power spectrum at different temperature. The experimental result shows that the noise markedly increases when the temperature decreases in- 30

0 ℃

and it respectively rises by 2. 7 times and 3. 6 times when the bias current is 1 mA and 2 mA. It is found that the contribution of the thermal noise is only a small part of the total noise

and the change of temperature mainly affects the generation-recombination noise and1 / f noise of the detector.

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Keywords

references

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不同响应波长的HgCdTe光导器件噪声分析 [J]. 张燕,方家熊. 光学学报 . 2008(07)

微机列车轴温探测系统 [J]. 秦雅娟,李旭. 交通与计算机 . 1998(02)

HgCdTe光导探测器的低频噪声 [J]. 朱惜辰,姚英. 红外研究 . 1989(05)

窄禁带半导体物理学[M]. 科学出版社 , 褚君浩著, 2005

Noise modeling of shunt resistance in HgCdTe photoconductor detectors [J] . R.K. Bhan,V. Gopal,R.S. Saxena,J.P. Singh. Infrared Physics and Technology . 2003 (2)

Prospects of uncooled HgCdTe detector technology [J] . W. E. Tennant,S. Cabelli,K. Spariosu. Journal of Electronic Materials . 1999 (6)

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