您当前的位置:
首页 >
文章列表页 >
Non-contact dynamic silicon wafer tester based on virtual instrument
更新时间:2025-09-11
    • Non-contact dynamic silicon wafer tester based on virtual instrument

    • Vol. 29, Issue 3, Pages: 59-61(2010)
    • DOI:10.13873/j.1000-97872010.03.023    

      CLC: TP216;TN304.07
    • Published:2010

    移动端阅览

  • YAN You-jun1, LI Yun-fei2. Non-contact dynamic silicon wafer tester based on virtual instrument[J]. 2010, 29(3): 59-61. DOI: 10.13873/j.1000-97872010.03.023.

  •  
  •  
icon
试读结束,您可以激活您的VIP账号继续阅读。
去激活 >
icon
试读结束,您可以通过登录账户,到个人中心,购买VIP会员阅读全文。
已是VIP会员?
去登录 >

0

Views

116

下载量

2

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

Response time measurement method for infrared detectors based on amplitude-frequency characteristic decoupling
Research on miniaturization of eddy current speed sensor
Design of working state monitoring system of domestic appliance
Simulation of eddy current sensor based on variable eddy current ring
Design of maglev eddy current displacement sensor based on LDC1614

Related Author

ZHANG Zhenyu
LU Jin
LEI Cheng
LI Tengteng
LI Fengchao
LIANG Ting
ZHENG Liangguang
LUO Rudan

Related Institution

National Key Laboratory of Extreme Environment Optoelectronic Dynamic Testing Technology and Instrument,North University of China
College of Vehicle Engineering,Hunan Automotive Engineering Vocational College
Ningbo CRRC Times Transducer Technology Co Ltd
CRRC Transducer Measurement Technology R & D Center
Xi’an Jiaotong University City College
0