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Study on anti over-loaded technology in high over-loaded storage testing
更新时间:2025-09-11
    • Study on anti over-loaded technology in high over-loaded storage testing

    • Vol. 28, Issue 9, Pages: 31-33(2009)
    • DOI:10.13873/j.1000-97872009.09.009    

      CLC: TP333
    • Published:2009

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  • WEN Feng, QIAO Jian-zhong, LI Yan. Study on anti over-loaded technology in high over-loaded storage testing[J]. 2009, 28(9): 31-33. DOI: 10.13873/j.1000-97872009.09.009.

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