Current measuring system of nano-material based on atomic force microscopy

LI Dong-sheng1; LI Min-qiang1; ZHENG Peng1

doi:10.13873/j.1000-97872008.11.033

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Current measuring system of nano-material based on atomic force microscopy

更新时间：2025-09-11

- Current measuring system of nano-material based on atomic force microscopy
- Vol. 27, Issue 11, Pages: 90-92(2008)
- 作者机构：
  
  1. 中国科学院合肥智能机械研究所
  2. 中国科学技术大学
- 作者简介：
- 基金信息：
- DOI：10.13873/j.1000-97872008.11.033
  CLC： TP274
- Published：2008
- 稿件说明：
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[1]李东升,李民强,郑鹏.基于原子力显微镜的纳米材料电流检测系统[J].传感器与微系统,2008,27(11):90-92.

LI Dong-sheng1, LI Min-qiang1, ZHENG Peng1. Current measuring system of nano-material based on atomic force microscopy[J]. 2008, 27(11): 90-92.
[1]李东升,李民强,郑鹏.基于原子力显微镜的纳米材料电流检测系统[J].传感器与微系统,2008,27(11):90-92. DOI： 10.13873/j.1000-97872008.11.033.

LI Dong-sheng1, LI Min-qiang1, ZHENG Peng1. Current measuring system of nano-material based on atomic force microscopy[J]. 2008, 27(11): 90-92. DOI： 10.13873/j.1000-97872008.11.033.

摘要

在实验室原有的原子力显微镜的基础上

进行硬件改造

实现纳米材料的电流检测。改造电路以PIC单片机为核心

与其他外围电路相互配合

结合Mplab集成开发环境进行嵌入式软件开发

并进行了实验

结果证明:该系统能够实现电流检测功能

并能可靠工作。

Abstract

Based on atomic force microscopy（AFM）

its circuit hardware is improved in the laboratory

so AFM has current measuring function of nano-material.PIC microcontroller controls other periphery circuits in this design

Mplab integrated development environment provides an environment to develop code for embedded microcontroller.The result of experiment tells that the system has current measuring function and can work well.

关键词

Keywords

references

纳米器件与材料的电气测量 [J]. Jonathan Tucker. 今日电子 . 2005(10)

AFM纳米加工系统设计 [J]. 朱吉牧,章海军,张冬仙. 光学仪器 . 2005(02)

新型原子力显微镜的研制及其应用 [J]. 张冬仙,章海军,李博,黄峰. 光子学报 . 2002(01)

PIC单片机实用教程[M]. 北京航空航天大学出版社 , 李学海编著, 2002

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Related Institution

School of Metallurgical and Ecological Engineering,University of Science and Technology Beijing

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