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Study on effect of different temperature profiles on electronic packaging reliability
更新时间:2025-09-11
    • Study on effect of different temperature profiles on electronic packaging reliability

    • Issue 4, Pages: 68-70+73(2008)
    • DOI:10.13873/j.1000-97872008.04.007    

      CLC: TB114.3
    • Published:2008

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  • YANG Ping, LI Ning, SHEN Cai-jun, et al. Study on effect of different temperature profiles on electronic packaging reliability[J]. 2008, (4): 68-70+73. DOI: 10.13873/j.1000-97872008.04.007.

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