Since the digital image correlation（ DIC） method is sensitive to illumination interference

a digital image correlation method based on center symmetric local binary pattern（ CS-LBP） is presented. CS-LBP features of the image template subarea before deformation is extracted. According to this feature

the target Subarea with the highest matching degree is found in the deformed image

and the deformation information of the Subarea is calculated by the relative position relationship between the template Subarea and the target Subarea. Experimental results indicate that when the change of illumination intensity is less than 5 000 lx

the error rate of increase of the presented method is reduced by 42. 8 % compared with traditional DIC methods. This method effectively improves the measurement precision of DIC method when illumination changes.