Radiation-tolerant digital pixel image sensor using enable detecting unit

YAN Xi; YAO Su-ying; GAO Zhi-yuan; LI Xin-wei; XU Jiang-tao

doi:10.13873/J.1000-9787(2016)11-0094-03

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Radiation-tolerant digital pixel image sensor using enable detecting unit

更新时间：2025-09-11

- Radiation-tolerant digital pixel image sensor using enable detecting unit
- Vol. 35, Issue 11, Pages: 94-96(2016)
- 作者机构：
  
  天津大学电子信息工程学院
- 作者简介：
- 基金信息：
- DOI：10.13873/J.1000-9787(2016)11-0094-03
  CLC： TP212
- Published：2016
- 稿件说明：
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[1]闫茜,姚素英,高志远,李新伟,徐江涛.应用使能检测单元的抗辐射数字像素图像传感器[J].传感器与微系统,2016,35(11):94-96.

YAN Xi, YAO Su-ying, GAO Zhi-yuan, et al. Radiation-tolerant digital pixel image sensor using enable detecting unit[J]. 2016, 35(11): 94-96.
[1]闫茜,姚素英,高志远,李新伟,徐江涛.应用使能检测单元的抗辐射数字像素图像传感器[J].传感器与微系统,2016,35(11):94-96. DOI： 10.13873/J.1000-9787(2016)11-0094-03.

YAN Xi, YAO Su-ying, GAO Zhi-yuan, et al. Radiation-tolerant digital pixel image sensor using enable detecting unit[J]. 2016, 35(11): 94-96. DOI： 10.13873/J.1000-9787(2016)11-0094-03.

摘要

介绍了一种经过抗辐射设计加固的CMOS数字像素图像传感器

并提出了一种可以抵抗单粒子效应的使能检测单元。这个使能检测单元通过将信号传输给三个移位寄存器并判断寄存器输出是否一致来判断和屏蔽单粒子效应。实验结果表明:芯片的最大信噪比和动态范围分别是54.15 d B和56.10 d B

使能检测单元可以屏蔽单粒子效应。

Abstract

A CMOS digital pixel image sensor using radiation-hardness-by-design method is intoduced. A novel enable detector cell is proposed for single event effects hardening. It is implemented by transmitting a signal through three shift registers

and then single event effect is prevented by detecting whether outputs of the registers are identical. Experimental results show that the maximum signal noise ratio（ SNR） and dynamic range of this chip can reach 54. 15 d B and 56. 10 d B

respectively

and the enable detector can shield single event effects（ SEE）.

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