Research on characteration method of uniformity of carbon nanotube thin films based on SEM images

CHEN Yan-hai; ZHANG Da-guo; NIE Peng

doi:10.13873/J.1000-9787(2016)02-0052-03

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Research on characteration method of uniformity of carbon nanotube thin films based on SEM images

更新时间：2025-09-11

- Research on characteration method of uniformity of carbon nanotube thin films based on SEM images
- Vol. 35, Issue 2, Pages: 52-54+57(2016)
- 作者机构：
  
  沈阳航空航天大学机电工程学院
- 作者简介：
- 基金信息：
- DOI：10.13873/J.1000-9787(2016)02-0052-03
  CLC： TQ127.11;TP391.41
- Published：2016
- 稿件说明：
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[1]陈彦海,张大国,聂鹏.基于SEM图像的碳纳米管薄膜均匀性表征方法研究[J].传感器与微系统,2016,35(02):52-54+57.

CHEN Yan-hai, ZHANG Da-guo, NIE Peng. Research on characteration method of uniformity of carbon nanotube thin films based on SEM images[J]. 2016, 35(2): 52-54+57.
[1]陈彦海,张大国,聂鹏.基于SEM图像的碳纳米管薄膜均匀性表征方法研究[J].传感器与微系统,2016,35(02):52-54+57. DOI： 10.13873/J.1000-9787(2016)02-0052-03.

CHEN Yan-hai, ZHANG Da-guo, NIE Peng. Research on characteration method of uniformity of carbon nanotube thin films based on SEM images[J]. 2016, 35(2): 52-54+57. DOI： 10.13873/J.1000-9787(2016)02-0052-03.

摘要

将多壁碳纳米管综合了超声处理和高速离心等分散工艺单分散后

采用喷射吸滤法制备碳纳米管薄膜

并研究超声时间对薄膜分布均匀性的影响。基于多重分形理论和SEM图像分析多壁碳纳米管薄膜的形态学特征。碳纳米管薄膜的分布均匀性主要取决于多重分形谱宽度Δa和最大、最小概率子集维数的差别Δf等分形参数。多重分形分析弥补了传统的表面评价和统计分析的不足。该碳纳米管薄膜均匀性表征方法将为碳纳米管薄膜的制备提供指导。

Abstract

Carbon nanotubes thin film is fabricated with monodispersion solution of multi-walled carbon nanotubes through spray-vacuum for characterizing carbon nanotubes thin films surface morphology based on SEM analysis.According to the multifractal spectrum analysis

it is found that the dispersion uniformity performance of carbon nanotubes thin film mainly depends on multifractal spectrum width Δa

multifractal analysis provides different complementary information to that offered by traditional surface evaluation and statistical analysis. This method will provide guidance for fabrication of carbon nanotube thin film.

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references

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