XING Xing, ZHU Yu-tian, WU Qiang, et al. Tensile test system of thin-film material based on virtual instruments[J]. 2010, 29(4): 134-136. DOI: 10.13873/j.1000-97872010.04.042.
Light-induced thin-film materials have great potential value in micro-electro-mechanical-system(MEMS) and tests of the basic physical parameters of thin-film material are important foundational work.whereas the present tensile machines in the market are too expensive and cannot meet the measurement needs under micro dimensions
a tensile test system of thin film material is designed which can activate precise and steady load.And a tensile test virtual instrument is programmed by LabVIEW to collect
analyze
process and store those data in tests
and output control signals.This system has the advantage of high resolution of 1 μm and 1mN
thereby satisfying the need of the micro-dimension tests.