YAO Rui, WANG You-ren, YU Sheng-lin, et al. Design and reliability analysis of self-repair TMR systems based on evolvable hardware[J]. 2007, (8): 72-75+78.
YAO Rui, WANG You-ren, YU Sheng-lin, et al. Design and reliability analysis of self-repair TMR systems based on evolvable hardware[J]. 2007, (8): 72-75+78. DOI: 10.13873/j.1000-97872007.08.004.
A new design method of self-repair triple-modular redundancy systems is proposed by introducing evolvable hardware into the traditional triple-modular redundancy system.There are multi-mechanisms of fault-tolerance and repair in the system:the system has a structure of triple-modular redundancy in the mass
which can check the fault modular autonomously;each modular is made up of subassemblies with spare parts
and can recover from fault fast by switching to the spare parts;while each subassembly in the modular can be repaired through evolution.The design method is proof-tested by a triple-modular redundancy 2 bit multiplier on-chip.Moreover
the reliability model of the system is given
and the reliability formula is educed.The reliability of the system is analyzed in theory.It is shown that the self-repair triple-modular redundancy system can recover from stuck-at faults effectively
and thus has longer life span and higher reliability than the conventional triple-modular redundancy system.