CHEN Jian-qun, MA Yi-wu, ZHANG Bin. Structure optimization of thick film pressure sensors[J]. 2006, (11): 57-60. DOI: 10.13873/j.1000-97872006.11.019.
厚膜压力传感器的结构优化
摘要
为提高厚膜压力传感器的稳定性
借助有限元分析软件Ansys
研究了厚膜压力传感器弹性体的应力分布
进而设计了应变电阻的尺寸
并优化了其布局。采用Ф18mm的96%A l2O3弹性体瓷件研制了一种新型厚膜力敏芯片
实验结果表明:它的热零点温漂小于3×10-4FS/℃
过载达120%
非线性误差及迟滞误差都小于±0.2%FS
精度由±0.4%FS提高到±0.2%FS
其线性度和稳定性得到很大提高
可广泛应用于仪器仪表、测控和导航等领域。
Abstract
To improve the stability of the thick film pressure sensors
their elastomeric stress distribution is studied by finite element analysis(FEA) software Ansys.Thus the strain gauge dimension is designed and their location is optimized.A new-style thick film pressure sensor is manufactured from Ф18 mm
96 %Al
2
O
3
elastomeric ceramic.Experimental results indicate that its zero drift is less than ±0.3 %FS/℃
its over loading is 120 %
its non-linearity and hysteresis error are less than ±0.2 %FS
and its precision is up to ±0.2 %FS from ±0.4 %FS.The thick film pressure sensors linearity and stability are largely improved.Therefore
the thick film pressure sensors can be used in scientific instrument
measure and control and aeronautical instrument field.