SUN Yan-ling. Application of Michelson micro-interference principle in the surface profile measuring[J]. 2006, (7): 52-54. DOI: 10.13873/j.1000-97872006.07.017.
迈克尔逊干涉原理在表面形貌测量中的应用研究
摘要
介绍了一种用于被测件表面形貌的测量分析系统
采用迈克尔逊显微干涉原理实现对表面形貌特征的快速、非接触测量
主要讨论了仪器的测量光路、横向工作台的粗、精两级驱动和信号的四细分处理
经实验证明:测量的相对误差为±0.39%。
Abstract
A measuring-analysing system for surface profile based on the Michelson micro-interference principle is described.This instrument can realize a quick and non-contact measurement with high accuracy.Principle of measuring
4 double frequency processing of photoelectric signal and a set of fine-rough two-grade driving of the horizontal platform are discussed.The experimental
results show that relative error is within±0.39 %.