YU Bi-qiang, WENG Hai-shan, LI Jiang. Research and applications of adhesion in micromachined accelerometer[J]. 2006, (6): 43-45+48. DOI: 10.13873/j.1000-97872006.06.014.
Adhesion is one of the reliability problems in MEMS.The adhesion problem of the representative MEMS product-micromachined accelerometer is studied
and expressions of peel number are proposed to predict the adhesion-related performance for two kinds of micromachined accelerometers.The peel number is used in multidisciplinary design optimization of micromachined accelerometer
and its influence on the structure design is discussed.