XIAO Jun-sheng, DU Zhi-jie, WANG Zhi-chun. Eddy current thickness measurement simulation analysis based on ANSYS[J]. 2018, 37(3): 26-28+31. DOI: 10.13873/j.1000-9787(2018)03-0026-03.
Using the finite element analysis software of ANSYS to simulation analyze on multi-layered conductive structure thickness measurement sensor. Simulate better physical model in theory as well as excitation frequency
excitation parameters such as voltage
coil number of turns. In cases of parameters such as frequency
coil number of turns are determined
by changing thickness
simulate corresponding relation of the measured body thickness and excitation voltage
fitting out corresponding formula
verify the correctness of the simulation through instrument.