ZHANG Chong, MA Shu-jun, LI Lu-lu, et al. Micro-nano displacement measurement system based on optical lever[J]. 2017, 36(11): 103-105+108. DOI: 10.13873/j.1000-9787(2017)11-0103-03.
Using self-designed optical lever light path system and position sensitive detector( PSD) to measure small deflection of cantilever. Experimental principle and system building are introduced. Experimental measurement and data analysis are implemented. The resolution of measurement system can reach 0.06 μm. Using this system to measure small deflection of homemade cantilever. Through comparing with the actual displacement of micro-positioning platform
the results are basically identical. It verifies reliability of the system.
Systematic characterization of optical beam deflection measurement system for micro and nanomechanical systems [J] . R.W. Herfst,W.A. Klop,M. Eschen,T.C. van den Dool,N.B. Koster,H. Sadeghian. Measurement . 2014
Imaging the surface stress and vibration modes of a microcantilever by laser beam deflection microscopy [J] . Javier Tamayo,Valerio Pini,Prisicila Kosaka,Nicolas F Martinez,Oscar Ahumada,Montserrat Calleja. Nanotechnology . 2012 (31)
A complete analysis of the laser beam deflection systems used in cantilever-based systems [J] . L.Y. Beaulieu,Michel Godin,Olivier Laroche,Vincent Tabard-Cossa,Peter Grütter. Ultramicroscopy . 2006 (4)