Under the nanometer process

the negative bias temperature instability（ NBTI） is the dominant factor affecting the aging effect of the circuit. Multi input vector control（ M-IVC） is an effective method to mitigate the NBTI effect

and the key to M-IVC is the solution of the optimal duty cycle. After fully considering the original design of the time margin and the actual operation of the circuit

the static timing analysis is used to accurately locate the critical path in the circuit. The improved adaptive genetic algorithm is used to solve the critical path for the best duty cycle. The experimental results show that when the time margin is 5 %

the average aging rate of the circuit is reduced by 1. 49 % compared with the existing scheme

and the average relative improvement rate is 18. 29 %.