LIU Chao, WANG Fa-mei, Lü Jing-wei, et al. Research on spectral characteristic of surface plasmon resonance of Ag-TiO2 thin films[J]. 2016, 35(3): 16-17+21.
LIU Chao, WANG Fa-mei, Lü Jing-wei, et al. Research on spectral characteristic of surface plasmon resonance of Ag-TiO2 thin films[J]. 2016, 35(3): 16-17+21. DOI: 10.13873/J.1000-9787(2016)03-0016-02.
Ag-TiO2薄膜表面等离子体共振光谱特性研究
摘要
以拓宽Ag膜波长调制型表面等离子体共振(SPR)传感器的工作波长区间
将Ti O
2
膜沉积于Ag膜表面制成Ag-Ti O
2
复合薄膜。利用数值计算方法对不同厚度Ag膜和Ag-Ti O
2
复合膜波长调制型SPR光谱特性进行仿真研究。仿真结果表明:共振吸收峰显著依赖于Ag膜厚度;当保持Ag-Ti O
2
复合膜厚度60 nm时
复合薄膜SPR波长随Ti O
2
厚度的增大而向长波长方向移动
发现红移;与60 nm厚Ag膜共振波长相比
12 nm厚Ti O
2
与48 nm厚Ag组成的复合膜共振波长红移超过200 nm。
Abstract
In order to broaden working wavelength range of surface plasmon resonance( SPR) sensors based on Ag thin film
deposit Ti O
2
thin film onto Ag film to fabricate Ag-Ti O
2
composite thin films. The spectral properties of wavelength modulation type SPR sensor based on Ag thin films and Ag-Ti O
2
composite thin films are simulation researched by means of numerical calculation method. The results of the simulation show that the resonance absorbing peaks of wavelength modulation type SPR remarkably depend on Ag film thickness. When the thickness of the composite film is kept at a constant thickness of 60 nm
the resonant wa
velength increases with increasing thickness of Ti O
2
thin films
red-shift occur; wavelength red-shift range can be up to over 200 nm for Ag-Ti O
2
composite films with a thickness of Ti O
2
film12 nm and Ag film 48 nm.
关键词
Keywords
references
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