ZHANG Jie, YANG Xiao-dong, JIANG Shu-wen, et al. Research and fabrication of NiCrAlY thin-film strain gauges[J]. 2015, 34(4): 105-107. DOI: 10.13873/J.1000-9787(2015)04-0105-03.
NiCrAlY薄膜应变计的研制
摘要
采用射频磁控溅射法在Ni基高温合金拉伸件上制备Ni Cr Al Y薄膜应变计。研究了热稳定处理对Ni Cr Al Y薄膜结构、表面形貌的影响
并且测试了Ni Cr Al Y薄膜应变计的电学与应变性能。结果表明:热稳定处理后Ni Cr Al Y薄膜应变计由于在表面形成了一层Al2O3膜
具有抗高温氧化的特性
在室温
8
00℃范围内
应变计电阻同温度呈线性变化
电阻温度系数(TCR)约为290×10-6/℃
室温下的应变计系数(GF)为2.1。
Abstract
Ni Cr Al Y thin film strain gauges are deposited on the nickel-based superalloy by radio-frequency magnetron sputtering. The effects of stabilized heat treatment at 1 000 ℃ on structure and surface morphology of Ni Cr Al Y thin films are investigated and the electromechanical properties of Ni Cr Al Y thin film strain gauges are measured. After stabilized heat treatment at 1 000 ℃
a layer of Al2O3 is formed on the surface of Ni Cr Al Y thin film
which is important cause for excellent high-temperature oxidation resistance. The variation of strain gauge resistance with temperature is linear in the temperature range from room temperature to 800 ℃. The temperature coefficient of resistance( TCR) is about 290 × 10-6/ ℃
and gauge factor( GF) is about 2. 1 at room temperature.
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